MicroTESK-Related Publications¶

• Table of contents
• MicroTESK-Related Publications
  • 2015
  • 2014
  • 2013
  • 2012
  • 2011

2015¶

• M. Chupilko, A. Kamkin, A. Kotsynyak, A. Protsenko, S. Smolov, A. Tatarnikov. Specification-Based Test Program Generation for ARM VMSAv8-64 Memory Management Units. Proceedings of the 16th International Workshop on Microprocessor Test and Verificaition, 2016.

• A. Kamkin, A. Protsenko, A. Tatarnikov. An Approach to Test Program Generation Based on Formal Specifications of Caching and Address Translation Mechanisms. Proceedings of the Institute for System Programming Volume 27 (Issue 3). 2015 y. pp. 125-138. http://ispras.ru/proceedings/docs/2015/27/3/isp_27_2015_3_125.pdf

2014¶

• A. Kamkin, T. Sergeeva, S. Smolov, A. Tatarnikov, M. Chupilko. Extensible Environment for Test Program Generation for Microprocessors. Programming and Computer Software. January 2014, Volume 40, Issue 1, P. 1-9. http://link.springer.com/article/10.1134%2FS0361768814010046

2013¶

• A. Kamkin, T. Sergeeva, A. Tatarnikov, A. Utekhin. MicroTESK: An Extendable Framework for Test Program Generation. Spring/Summer Young Researchers’ Colloquium on Software Engineering (SYRCoSE), 2013. P. 51-57. http://syrcose.ispras.ru/2013/files/submissions/08_syrcose2013.pdf

• A. Tatarnikov. Architecture Model Based Microprocessor Test Generation Tool. Master’s Degree Thesis, National Research University "Higher School of Economics", School of Software Engineering, Moscow, Russian Federation, June 2013. http://www.hse.ru/data/2013/05/28/1284900629/thesis.pdf

2012¶

• A. Kamkin, A. Tatarnikov. MicroTESK: An ADL-Based Reconfigurable Test Program Generator for Microprocessors. Spring/Summer Young Researchers’ Colloquium on Software Engineering (SYRCoSE), 2012. P. 64-69. http://syrcose.ispras.ru/2012/files/submissions/08_syrcose2012_submission_25.pdf

2011¶

• A. Kamkin, E. Kornykhin, D. Vorobyev. Reconfigurable Model-Based Test Program Generator for Microprocessors. IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), 2011. P. 47-54. http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5954389