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MicroTESK 2.2.0 alpha released

Added by Andrei Tatarnikov almost 3 years ago

The new minor version of MicroTESK contains the following new features and changes:

  • Support for automated extraction of coverage information that allows building constraints for named paths in instruction control flow (*)
  • Possibility to process test templates in a stream manner (block by block), which allows processing larger test templates
  • The trace method of the test template language now accepts objects created by the rand method
  • Several minor bug fixes and general improvements

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

What's new (*):

Coverage Information Extraction

The main feature of the new release is extraction of test situations for named paths in the instruction control flow. Test situations are described as constraints on input parameters which should be satisfied in order to cause execution of a specific path. Test data is generated by solving the constraints specified in a test template.

Paths can be marked in ISA specifications using the mark function. For example, here is a part of the miniMIPS ADD instruction specification where two possible execution paths are marked as normal and overflow:

op add (rd: REG, rs: REG, rt: REG)
  syntax = format("add %s, %s, %s", rd.syntax, rs.syntax, rt.syntax)
  image = format("000000%s%s%s00000100000", rs.image, rt.image, rd.image)
  action = {
    temp = rs<31>::rs + rt<31>::rt;
    if temp<32> != temp<31> then
      mark("overflow");
      exception("IntegerOverflow");
    else
      mark("normal");
      rd = temp<31..0>;
    endif;
  }

Test situations to be covered by tests are specified in test templates using the name of the instruction and the name of the path. For example:

add t0, t1, t2 do situation('add.overflow') end
add t3, t4, t5 do situation('add.normal') end

NOTE: To generate test data based on constraints, MicroTESK requires the Z3 solver to be installed. See Installation Guide for more information.

MicroTESK 2.1.2 released

Added by Andrei Tatarnikov about 3 years ago

The new release contains the following changes:

  • Facilities to describe data segment in test templates were implemented
  • Function 'trace' (nML) was supported
  • Possibility to create instances of modes and ops in nML code was implemented
  • Aliases for memory locations (mem, reg, var) were supported
  • Specification of the miniMIPS ISA was added to the examples

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK 2.1.0 released

Added by Andrei Tatarnikov over 3 years ago

The new release contains the following changes:

  • Support for VLIW was implemented
  • Support for floating-point types was implemented
  • Ability to specify initialization code in test templates (the 'preparator' construct) was implemented
  • New test data generators were implemented
  • The test templates library was improved (including new text printing facilities and ability to specify unknown immediate values)
  • New examples of test templates demonstrating features of MicroTESK were added
  • Ability to use labels rather than addresses in the generated code was implemented

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK to be presented at DAC 2014

Added by Alexander Kamkin over 3 years ago

The MicroTESK framework will be presented at the University Booth exhibition and PhD Forum of the Design Automation Conference (DAC) - the premier conference for design and automation of electronic systems. The conference will take place on June 1-5 in San Francisco, CA, USA.

DAC offers outstanding training, education, exhibits and superb networking opportunities for designers, researchers, tool developers and vendors. The conference is sponsored by the Association for Computing Machinery (ACM), the Electronic Design Automation Consortium (EDA Consortium), and the Institute of Electrical and Electronics Engineers (IEEE), and is supported by ACM's Special Interest Group on Design. Read more...

MicroTESK 2.0.2 released

Added by Alexander Kamkin almost 4 years ago

MicroTESK 2.0.2 has been released. The build contains the following changes:

  • An ability to manualy specify initialization code was implemented
  • The test templates library was improved
  • Test template examples for ARM were updated
  • Several bugs related to installation of MicroTESK were fixed
  • Default test situations Random and Zero were provided

MicroTESK 2.0.1 released

Added by Alexander Kamkin almost 4 years ago

We are happy to announce the first build of the MicroTESK 2.0 test program generator.

MicroTESK (Microprocessor TEsting and Specification Kit) is a reconfigurable framework for generating test programs for microprocessors and other programmable devices. The tool is customized for a specific instruction-set architecture with formal specifications in nML/Sim-nML language. Test programs are generated on a basis of test templates written in Ruby, which are abstract descriptions of test scenarios. Read more...

To generate test data, MicroTESK requires the Z3 solver be installed. See Installation Guide for more information.

The tool can be downloaded from the file page:
http://forge.ispras.ru/projects/microtesk/files

You are welcome to report bugs and leave your feedback at the main project site:
http://forge.ispras.ru/projects/microtesk

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