News

MicroTESK 2.1.3 released

Added by Andrei Tatarnikov about 2 years ago

The new release contains the following changes:

  • Several bug fixes and general improvements have been made

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK 2.1.2 released

Added by Andrei Tatarnikov about 2 years ago

The new release contains the following changes:

  • Facilities to describe data segment in test templates were implemented
  • Function 'trace' (nML) was supported
  • Possibility to create instances of modes and ops in nML code was implemented
  • Aliases for memory locations (mem, reg, var) were supported
  • Specification of the miniMIPS ISA was added to the examples

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK 2.1.1 released

Added by Andrei Tatarnikov over 2 years ago

The new release contains the following changes:

  • Issue related to processing test templates under Windows was fixed

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK 2.1.0 released

Added by Andrei Tatarnikov over 2 years ago

The new release contains the following changes:

  • Support for VLIW was implemented
  • Support for floating-point types was implemented
  • Ability to specify initialization code in test templates (the 'preparator' construct) was implemented
  • New test data generators were implemented
  • The test templates library was improved (including new text printing facilities and ability to specify unknown immediate values)
  • New examples of test templates demonstrating features of MicroTESK were added
  • Ability to use labels rather than addresses in the generated code was implemented

The MicroTESK distribution package can be downloaded from here: http://forge.ispras.ru/projects/microtesk/files

MicroTESK to be presented at DAC 2014

Added by Alexander Kamkin almost 3 years ago

The MicroTESK framework will be presented at the University Booth exhibition and PhD Forum of the Design Automation Conference (DAC) - the premier conference for design and automation of electronic systems. The conference will take place on June 1-5 in San Francisco, CA, USA.

DAC offers outstanding training, education, exhibits and superb networking opportunities for designers, researchers, tool developers and vendors. The conference is sponsored by the Association for Computing Machinery (ACM), the Electronic Design Automation Consortium (EDA Consortium), and the Institute of Electrical and Electronics Engineers (IEEE), and is supported by ACM's Special Interest Group on Design. Read more...

MicroTESK 2.0.2 released

Added by Alexander Kamkin almost 3 years ago

MicroTESK 2.0.2 has been released. The build contains the following changes:

  • An ability to manualy specify initialization code was implemented
  • The test templates library was improved
  • Test template examples for ARM were updated
  • Several bugs related to installation of MicroTESK were fixed
  • Default test situations Random and Zero were provided

MicroTESK 2.0.1 released

Added by Alexander Kamkin about 3 years ago

We are happy to announce the first build of the MicroTESK 2.0 test program generator.

MicroTESK (Microprocessor TEsting and Specification Kit) is a reconfigurable framework for generating test programs for microprocessors and other programmable devices. The tool is customized for a specific instruction-set architecture with formal specifications in nML/Sim-nML language. Test programs are generated on a basis of test templates written in Ruby, which are abstract descriptions of test scenarios. Read more...

To generate test data, MicroTESK requires the Z3 solver be installed. See Installation Guide for more information.

The tool can be downloaded from the file page:
http://forge.ispras.ru/projects/microtesk/files

You are welcome to report bugs and leave your feedback at the main project site:
http://forge.ispras.ru/projects/microtesk

MicroTESK to be presented at DATE 2014

Added by Alexander Kamkin about 3 years ago

The MicroTESK tool will be presented at the University Booth exhibition of the DATE 2014 conference - one of the biggest European events for electronic system design and test. The conference & exhibition will take place on March 24-28 in Dresden, Germany.

DATE, the Design, Automation and Test Conference and Exhibition, is the unique European event bringing together researchers together researchers, users and vendors as well as specialists in design, test and manufacturing of electronic circuits and systems. The University Booth is a part of the DATE program. It is sponsored by the European Design and Automation Association, the EDA Consortium, the IEEE Council on EDA, ECSI, ACM SIGDA, and Russian Academy of Sciences. Read more...

MicroTESK to be presented at SYRCoSE 2013

Added by Alexander Kamkin almost 4 years ago

We will make a presentation 'MicroTESK: An Extendable Framework for Test Program Generation' at the Spring/Summer Young Researchers' Colloquim on Software Engineering (SYRCoSE). The event will take place on May 30-31 in Kazan, Russia.

SYRCoSE is a colloquium on software engineering targeted at young researchers (students, postgraduates, young PhD specialists, etc.). The main goal of the colloquium is to help young specialists to meet each other, to get more information on work of their colleagues, to exchange their experience, and to practice in presenting their results at international conferences and workshops. Read more...

MicroTESK to be presented at DATE 2013

Added by Alexander Kamkin about 4 years ago

The MicroTESK tool will be presented at the University Booth exhibition of the DATE 2013 conference - one of the biggest European events for electronic system design and test. The conference & exhibition will take place on March 18-21 in Grenoble, France.

DATE, the Design, Automation and Test Conference and Exhibition, is the unique European event bringing together researchers together researchers, users and vendors as well as specialists in design, test and manufacturing of electronic circuits and systems. The University Booth is a part of the DATE program. It is sponsored by the DATE Sponsor Society, by the European Design and Automation Association, the EDA Consortium, the IEEE Computer Society – TTTC and CEDA, ECSI, ACM SIGDA, and the Russian Academy of Sciences. Read more...

Pictures of DATE 2013

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